Estimation of Uncertainty in Plate Thickness Measurement By X-ray Fluorescence Spectrometry. Staudt, G. E 3:13, 1993. abstract bibtex A foundation is developed for assessment of the uncertainty of coating layer thickness analysis using commercial x-ray fluorescence instrumentation. Proper evaluation of the measurement uncertainty is requisite for effectual application to plating process control and product disposition, but traditional methods of assessment (by repetitive measurement) are inadequate due to exclusion of major sources of experimental variability. The major sources of measurement uncertainty are identified and their contributions to the overall uncertainty of the analytical results are estimated. The effect of calibration uncertainty due to variation in calibration standards is found to be dominant under many practical circumstances. Failure to account for these important sources of variation properly will yield substantial underestimates of the overall measurement uncertainty that will seriously compromise efforts to improve plating process control and plated product quality.
@article{staudt_estimation_1993,
title = {Estimation of {Uncertainty} in {Plate} {Thickness} {Measurement} {By} {X}-ray {Fluorescence} {Spectrometry}},
volume = {3},
abstract = {A foundation is developed for assessment of the uncertainty of coating layer thickness analysis using commercial x-ray fluorescence instrumentation. Proper evaluation of the measurement uncertainty is requisite for effectual application to plating process control and product disposition, but traditional methods of assessment (by repetitive measurement) are inadequate due to exclusion of major sources of experimental variability. The major sources of measurement uncertainty are identified and their contributions to the overall uncertainty of the analytical results are estimated. The effect of calibration uncertainty due to variation in calibration standards is found to be dominant under many practical circumstances. Failure to account for these important sources of variation properly will yield substantial underestimates of the overall measurement uncertainty that will seriously compromise efforts to improve plating process control and plated product quality.},
language = {en},
author = {Staudt, Glenn E},
year = {1993},
pages = {13},
}
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{"_id":"EZSpRs8eiEtJAYgYx","bibbaseid":"staudt-estimationofuncertaintyinplatethicknessmeasurementbyxrayfluorescencespectrometry-1993","author_short":["Staudt, G. E"],"bibdata":{"bibtype":"article","type":"article","title":"Estimation of Uncertainty in Plate Thickness Measurement By X-ray Fluorescence Spectrometry","volume":"3","abstract":"A foundation is developed for assessment of the uncertainty of coating layer thickness analysis using commercial x-ray fluorescence instrumentation. Proper evaluation of the measurement uncertainty is requisite for effectual application to plating process control and product disposition, but traditional methods of assessment (by repetitive measurement) are inadequate due to exclusion of major sources of experimental variability. The major sources of measurement uncertainty are identified and their contributions to the overall uncertainty of the analytical results are estimated. The effect of calibration uncertainty due to variation in calibration standards is found to be dominant under many practical circumstances. Failure to account for these important sources of variation properly will yield substantial underestimates of the overall measurement uncertainty that will seriously compromise efforts to improve plating process control and plated product quality.","language":"en","author":[{"propositions":[],"lastnames":["Staudt"],"firstnames":["Glenn","E"],"suffixes":[]}],"year":"1993","pages":"13","bibtex":"@article{staudt_estimation_1993,\n\ttitle = {Estimation of {Uncertainty} in {Plate} {Thickness} {Measurement} {By} {X}-ray {Fluorescence} {Spectrometry}},\n\tvolume = {3},\n\tabstract = {A foundation is developed for assessment of the uncertainty of coating layer thickness analysis using commercial x-ray fluorescence instrumentation. Proper evaluation of the measurement uncertainty is requisite for effectual application to plating process control and product disposition, but traditional methods of assessment (by repetitive measurement) are inadequate due to exclusion of major sources of experimental variability. The major sources of measurement uncertainty are identified and their contributions to the overall uncertainty of the analytical results are estimated. The effect of calibration uncertainty due to variation in calibration standards is found to be dominant under many practical circumstances. Failure to account for these important sources of variation properly will yield substantial underestimates of the overall measurement uncertainty that will seriously compromise efforts to improve plating process control and plated product quality.},\n\tlanguage = {en},\n\tauthor = {Staudt, Glenn E},\n\tyear = {1993},\n\tpages = {13},\n}\n\n","author_short":["Staudt, G. E"],"key":"staudt_estimation_1993","id":"staudt_estimation_1993","bibbaseid":"staudt-estimationofuncertaintyinplatethicknessmeasurementbyxrayfluorescencespectrometry-1993","role":"author","urls":{},"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/pmanti","dataSources":["t4G55bmn46QNNuAWs"],"keywords":[],"search_terms":["estimation","uncertainty","plate","thickness","measurement","ray","fluorescence","spectrometry","staudt"],"title":"Estimation of Uncertainty in Plate Thickness Measurement By X-ray Fluorescence Spectrometry","year":1993}