@article{stevens_subsampled_2018,
	title = {Subsampled {STEM}-ptychography},
	volume = {113},
	issn = {0003-6951},
	url = {https://aip.scitation.org/doi/full/10.1063/1.5040496},
	doi = {10.1063/1.5040496},
	abstract = {Ptychography has been shown to be an efficient phase contrast imaging technique for scanning transmission electron microscopes (STEM). STEM-ptychography uses a fast pixelated detector to collect a “4-dimensional” dataset consisting of a 2D electron diffraction pattern at every probe position of a 2D raster-scan. This 4D dataset can be used to recover the phase-image. Current camera technology, unfortunately, can only achieve a frame rate of a few thousand detector frames-per-second (fps), which means that the acquisition time of the 4D dataset is up to 1000× slower than the scanning speed in a conventional STEM, thereby limiting the potential applications of this method for dose-fragile and dynamic specimens. In this letter, we demonstrate that subsampling provides an effective method for optimizing ptychographic acquisition by reducing both the number of detector-pixels and the number of probe positions. Subsampling and recovery of the 4D dataset are shown using an experimental 4D dataset with randomly removed detector-pixels and probe positions. After compressive sensing recovery, Wigner distribution deconvolution is applied to obtain phase-images. Randomly sampling both the probe positions and the detector at 10\% gives sufficient information for phase-retrieval and reduces acquisition time by 100×, thereby making STEM-ptychography competitive with conventional STEM.},
	number = {3},
	urldate = {2021-05-24},
	journal = {Applied Physics Letters},
	author = {Stevens, Andrew and Yang, Hao and Hao, Weituo and Jones, Lewys and Ophus, Colin and Nellist, Peter D. and Browning, Nigel D.},
	month = jul,
	year = {2018},
	note = {Publisher: American Institute of Physics},
	keywords = {STEM, methods, ptychography},
	pages = {033104},
}

{"_id":"RkWPJg8haQmKb7Lsd","bibbaseid":"stevens-yang-hao-jones-ophus-nellist-browning-subsampledstemptychography-2018","author_short":["Stevens, A.","Yang, H.","Hao, W.","Jones, L.","Ophus, C.","Nellist, P. D.","Browning, N. D."],"bibdata":{"bibtype":"article","type":"article","title":"Subsampled STEM-ptychography","volume":"113","issn":"0003-6951","url":"https://aip.scitation.org/doi/full/10.1063/1.5040496","doi":"10.1063/1.5040496","abstract":"Ptychography has been shown to be an efficient phase contrast imaging technique for scanning transmission electron microscopes (STEM). STEM-ptychography uses a fast pixelated detector to collect a “4-dimensional” dataset consisting of a 2D electron diffraction pattern at every probe position of a 2D raster-scan. This 4D dataset can be used to recover the phase-image. Current camera technology, unfortunately, can only achieve a frame rate of a few thousand detector frames-per-second (fps), which means that the acquisition time of the 4D dataset is up to 1000× slower than the scanning speed in a conventional STEM, thereby limiting the potential applications of this method for dose-fragile and dynamic specimens. In this letter, we demonstrate that subsampling provides an effective method for optimizing ptychographic acquisition by reducing both the number of detector-pixels and the number of probe positions. Subsampling and recovery of the 4D dataset are shown using an experimental 4D dataset with randomly removed detector-pixels and probe positions. After compressive sensing recovery, Wigner distribution deconvolution is applied to obtain phase-images. Randomly sampling both the probe positions and the detector at 10% gives sufficient information for phase-retrieval and reduces acquisition time by 100×, thereby making STEM-ptychography competitive with conventional STEM.","number":"3","urldate":"2021-05-24","journal":"Applied Physics Letters","author":[{"propositions":[],"lastnames":["Stevens"],"firstnames":["Andrew"],"suffixes":[]},{"propositions":[],"lastnames":["Yang"],"firstnames":["Hao"],"suffixes":[]},{"propositions":[],"lastnames":["Hao"],"firstnames":["Weituo"],"suffixes":[]},{"propositions":[],"lastnames":["Jones"],"firstnames":["Lewys"],"suffixes":[]},{"propositions":[],"lastnames":["Ophus"],"firstnames":["Colin"],"suffixes":[]},{"propositions":[],"lastnames":["Nellist"],"firstnames":["Peter","D."],"suffixes":[]},{"propositions":[],"lastnames":["Browning"],"firstnames":["Nigel","D."],"suffixes":[]}],"month":"July","year":"2018","note":"Publisher: American Institute of Physics","keywords":"STEM, methods, ptychography","pages":"033104","bibtex":"@article{stevens_subsampled_2018,\n\ttitle = {Subsampled {STEM}-ptychography},\n\tvolume = {113},\n\tissn = {0003-6951},\n\turl = {https://aip.scitation.org/doi/full/10.1063/1.5040496},\n\tdoi = {10.1063/1.5040496},\n\tabstract = {Ptychography has been shown to be an efficient phase contrast imaging technique for scanning transmission electron microscopes (STEM). STEM-ptychography uses a fast pixelated detector to collect a “4-dimensional” dataset consisting of a 2D electron diffraction pattern at every probe position of a 2D raster-scan. This 4D dataset can be used to recover the phase-image. Current camera technology, unfortunately, can only achieve a frame rate of a few thousand detector frames-per-second (fps), which means that the acquisition time of the 4D dataset is up to 1000× slower than the scanning speed in a conventional STEM, thereby limiting the potential applications of this method for dose-fragile and dynamic specimens. In this letter, we demonstrate that subsampling provides an effective method for optimizing ptychographic acquisition by reducing both the number of detector-pixels and the number of probe positions. Subsampling and recovery of the 4D dataset are shown using an experimental 4D dataset with randomly removed detector-pixels and probe positions. After compressive sensing recovery, Wigner distribution deconvolution is applied to obtain phase-images. Randomly sampling both the probe positions and the detector at 10\\% gives sufficient information for phase-retrieval and reduces acquisition time by 100×, thereby making STEM-ptychography competitive with conventional STEM.},\n\tnumber = {3},\n\turldate = {2021-05-24},\n\tjournal = {Applied Physics Letters},\n\tauthor = {Stevens, Andrew and Yang, Hao and Hao, Weituo and Jones, Lewys and Ophus, Colin and Nellist, Peter D. and Browning, Nigel D.},\n\tmonth = jul,\n\tyear = {2018},\n\tnote = {Publisher: American Institute of Physics},\n\tkeywords = {STEM, methods, ptychography},\n\tpages = {033104},\n}\n\n","author_short":["Stevens, A.","Yang, H.","Hao, W.","Jones, L.","Ophus, C.","Nellist, P. D.","Browning, N. D."],"key":"stevens_subsampled_2018","id":"stevens_subsampled_2018","bibbaseid":"stevens-yang-hao-jones-ophus-nellist-browning-subsampledstemptychography-2018","role":"author","urls":{"Paper":"https://aip.scitation.org/doi/full/10.1063/1.5040496"},"keyword":["STEM","methods","ptychography"],"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://bibbase.org/zotero/hexane","dataSources":["PMupqmDbRNFndeT5W"],"keywords":["stem","methods","ptychography"],"search_terms":["subsampled","stem","ptychography","stevens","yang","hao","jones","ophus","nellist","browning"],"title":"Subsampled STEM-ptychography","year":2018}