Cryogen-free 1kA-class Ic measurement system featuring an 8 T HTS magnet. Strickland, N. M., Hoffmann, C, Wimbush, S. C., Pooke, D. M., Huang, T., Lazic, Z., Chamritski, V., Talantsev, E. F., Long, N. J., & Tallon, J. L. J. Phys.: Conf. Ser., 507(2):022037, May, 2014. doi abstract bibtex We have developed a cryogen-free critical-current (Ic) measuring system comprising a conduction-cooled 8 T HTS magnet and convection-cooled sample, both cooled by commercial cryocoolers. The sample can be rotated and transport currents of up to 800 A delivered with less than 0.5 K temperature rise during the Ic measurement. The system is automated with respect to variations in temperature (30–90 K), field (0–8 T), and field angle (0–360°). We have used this system to measure HTS wire samples, concentrating on metalorganic deposited YBCO on RABiTS substrates. Particular emphasis is given to the evolution of Ic anisotropy with temperature, and the dangers of extrapolating from 77 K to 30 K.
@article{strickland_cryogen-free_2014,
title = {Cryogen-free {1kA}-class {Ic} measurement system featuring an 8 {T} {HTS} magnet},
volume = {507},
issn = {1742-6596},
doi = {10.1088/1742-6596/507/2/022037},
abstract = {We have developed a cryogen-free critical-current (Ic) measuring system comprising a conduction-cooled 8 T HTS magnet and convection-cooled sample, both cooled by commercial cryocoolers. The sample can be rotated and transport currents of up to 800 A delivered with less than 0.5 K temperature rise during the Ic measurement. The system is automated with respect to variations in temperature (30–90 K), field (0–8 T), and field angle (0–360°). We have used this system to measure HTS wire samples, concentrating on metalorganic deposited YBCO on RABiTS substrates. Particular emphasis is given to the evolution of Ic anisotropy with temperature, and the dangers of extrapolating from 77 K to 30 K.},
language = {en},
number = {2},
journal = {J. Phys.: Conf. Ser.},
author = {Strickland, N. M. and Hoffmann, C and Wimbush, S. C. and Pooke, D. M. and Huang, T. and Lazic, Z. and Chamritski, V. and Talantsev, E. F. and Long, N. J. and Tallon, J. L.},
month = may,
year = {2014},
pages = {022037},
file = {Strickland et al. - 2014 - Cryogen-free 1kA-class Ic measurement system featu.pdf:C\:\\Users\\scwim\\OneDrive\\Work\\Zotero Library\\Strickland et al. - 2014 - Cryogen-free 1kA-class Ic measurement system featu.pdf:application/pdf},
}
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