Can Patterns Improve i* Modeling? Two Exploratory Studies. Strohmaier, M., Horkoff, J., Yu, E. S. K., Aranda, J., & Easterbrook, S. M. In Paech, B. & Rolland, C., editors, Requirements Engineering: Foundation for Software Quality, 14th International Working Conference, REFSQ 2008, Montpellier, France, June 16-17, 2008, Proceedings, volume 5025, of Lecture Notes in Computer Science, pages 153–167, 2008. Springer.
Can Patterns Improve i* Modeling? Two Exploratory Studies [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/refsq/StrohmaierHYAE08,
  author    = {Markus Strohmaier and
               Jennifer Horkoff and
               Eric S. K. Yu and
               Jorge Aranda and
               Steve M. Easterbrook},
  editor    = {Barbara Paech and
               Colette Rolland},
  title     = {Can Patterns Improve i* Modeling? Two Exploratory Studies},
  booktitle = {Requirements Engineering: Foundation for Software Quality, 14th International
               Working Conference, {REFSQ} 2008, Montpellier, France, June 16-17,
               2008, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {5025},
  pages     = {153--167},
  publisher = {Springer},
  year      = {2008},
  url       = {https://doi.org/10.1007/978-3-540-69062-7\_16},
  doi       = {10.1007/978-3-540-69062-7\_16},
  timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/refsq/StrohmaierHYAE08.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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