Can Patterns Improve i* Modeling? Two Exploratory Studies

Can Patterns Improve i* Modeling? Two Exploratory Studies. Strohmaier, M., Horkoff, J., Yu, E. S. K., Aranda, J., & Easterbrook, S. M. In Paech, B. & Rolland, C., editors, Requirements Engineering: Foundation for Software Quality, 14th International Working Conference, REFSQ 2008, Montpellier, France, June 16-17, 2008, Proceedings, volume 5025, of Lecture Notes in Computer Science, pages 153–167, 2008. Springer.

Paper doi bibtex

@inproceedings{DBLP:conf/refsq/StrohmaierHYAE08,
  author       = {Markus Strohmaier and
                  Jennifer Horkoff and
                  Eric S. K. Yu and
                  Jorge Aranda and
                  Steve M. Easterbrook},
  editor       = {Barbara Paech and
                  Colette Rolland},
  title        = {Can Patterns Improve i* Modeling? Two Exploratory Studies},
  booktitle    = {Requirements Engineering: Foundation for Software Quality, 14th International
                  Working Conference, {REFSQ} 2008, Montpellier, France, June 16-17,
                  2008, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {5025},
  pages        = {153--167},
  publisher    = {Springer},
  year         = {2008},
  url          = {https://doi.org/10.1007/978-3-540-69062-7\_16},
  doi          = {10.1007/978-3-540-69062-7\_16},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/refsq/StrohmaierHYAE08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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