Boundary scan BIST methodology for reconfigurable systems. Su, C., Jeng, S., & Chen, Y. In ITC, pages 774-783, 1998. IEEE Computer Society.
Boundary scan BIST methodology for reconfigurable systems. [link]Link  Boundary scan BIST methodology for reconfigurable systems. [link]Paper  bibtex   
@inproceedings{conf/itc/SuJC98,
  added-at = {2015-08-26T00:00:00.000+0200},
  author = {Su, Chauchin and Jeng, Shung-Won and Chen, Yue-Tsang},
  biburl = {https://www.bibsonomy.org/bibtex/228178e02174204a5d28e12dd2adfe32c/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/1998},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743260},
  interhash = {c7a2f8bbf8eda44e71916d8b9208c453},
  intrahash = {28178e02174204a5d28e12dd2adfe32c},
  isbn = {0-7803-5093-6},
  keywords = {dblp},
  pages = {774-783},
  publisher = {IEEE Computer Society},
  timestamp = {2015-08-29T11:43:09.000+0200},
  title = {Boundary scan BIST methodology for reconfigurable systems.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc1998.html#SuJC98},
  year = 1998
}

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