Intra-Cell Defects Diagnosis. Sun, Z., Bosio, A., Dilillo, L., Girard, P., Pravossoudovich, S., Virazel, A., & Auvray, E. J. Electronic Testing (ET), 30(5):541-555, 2014.
Intra-Cell Defects Diagnosis [link]Paper  bibtex   
@article{ dblp1737126,
  title = {Intra-Cell Defects Diagnosis},
  author = {Zhenzhou Sun and Alberto Bosio and Luigi Dilillo and Patrick Girard and S. Pravossoudovich and Arnaud Virazel and Etienne Auvray},
  author_short = {Sun, Z. and Bosio, A. and Dilillo, L. and Girard, P. and Pravossoudovich, S. and Virazel, A. and Auvray, E.},
  bibtype = {article},
  type = {article},
  year = {2014},
  key = {dblp1737126},
  id = {dblp1737126},
  biburl = {http://www.dblp.org/rec/bibtex/journals/et/SunBDGPVA14},
  url = {http://dx.doi.org/10.1007/s10836-014-5481-5},
  journal = {J. Electronic Testing (ET)},
  pages = {541-555},
  number = {5},
  volume = {30},
  text = {J. Electronic Testing (ET) 30(5):541-555 (2014)}
}

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