Intra-Cell Defects Diagnosis. Sun, Z., Bosio, A., Dilillo, L., Girard, P., Pravossoudovich, S., Virazel, A., & Auvray, E. J. Electronic Testing (ET), 30(5):541-555, 2014. Paper bibtex @article{ dblp1737126,
title = {Intra-Cell Defects Diagnosis},
author = {Zhenzhou Sun and Alberto Bosio and Luigi Dilillo and Patrick Girard and S. Pravossoudovich and Arnaud Virazel and Etienne Auvray},
author_short = {Sun, Z. and Bosio, A. and Dilillo, L. and Girard, P. and Pravossoudovich, S. and Virazel, A. and Auvray, E.},
bibtype = {article},
type = {article},
year = {2014},
key = {dblp1737126},
id = {dblp1737126},
biburl = {http://www.dblp.org/rec/bibtex/journals/et/SunBDGPVA14},
url = {http://dx.doi.org/10.1007/s10836-014-5481-5},
journal = {J. Electronic Testing (ET)},
pages = {541-555},
number = {5},
volume = {30},
text = {J. Electronic Testing (ET) 30(5):541-555 (2014)}
}
Downloads: 0
{"_id":"TLqGdMyJFbkTfFphG","bibbaseid":"sun-bosio-dilillo-girard-pravossoudovich-virazel-auvray-intracelldefectsdiagnosis-2014","downloads":0,"creationDate":"2015-04-07T17:36:59.412Z","title":"Intra-Cell Defects Diagnosis","author_short":["Sun, Z.","Bosio, A.","Dilillo, L.","Girard, P.","Pravossoudovich, S.","Virazel, A.","Auvray, E."],"year":2014,"bibtype":"article","biburl":"http://www.dblp.org/rec/bibtex/journals/et/SunBDGPVA14","bibdata":{"title":"Intra-Cell Defects Diagnosis","author":["Zhenzhou Sun","Alberto Bosio","Luigi Dilillo","Patrick Girard","S. Pravossoudovich","Arnaud Virazel","Etienne Auvray"],"author_short":["Sun, Z.","Bosio, A.","Dilillo, L.","Girard, P.","Pravossoudovich, S.","Virazel, A.","Auvray, E."],"bibtype":"article","type":"article","year":"2014","key":"dblp1737126","id":"dblp1737126","biburl":"http://www.dblp.org/rec/bibtex/journals/et/SunBDGPVA14","url":"http://dx.doi.org/10.1007/s10836-014-5481-5","journal":"J. Electronic Testing (ET)","pages":"541-555","number":"5","volume":"30","text":"J. Electronic Testing (ET) 30(5):541-555 (2014)","bibtex":"@article{ dblp1737126,\n title = {Intra-Cell Defects Diagnosis},\n author = {Zhenzhou Sun and Alberto Bosio and Luigi Dilillo and Patrick Girard and S. Pravossoudovich and Arnaud Virazel and Etienne Auvray},\n author_short = {Sun, Z. and Bosio, A. and Dilillo, L. and Girard, P. and Pravossoudovich, S. and Virazel, A. and Auvray, E.},\n bibtype = {article},\n type = {article},\n year = {2014},\n key = {dblp1737126},\n id = {dblp1737126},\n biburl = {http://www.dblp.org/rec/bibtex/journals/et/SunBDGPVA14},\n url = {http://dx.doi.org/10.1007/s10836-014-5481-5},\n journal = {J. Electronic Testing (ET)},\n pages = {541-555},\n number = {5},\n volume = {30},\n text = {J. Electronic Testing (ET) 30(5):541-555 (2014)}\n}","bibbaseid":"sun-bosio-dilillo-girard-pravossoudovich-virazel-auvray-intracelldefectsdiagnosis-2014","role":"author","urls":{"Paper":"http://dx.doi.org/10.1007/s10836-014-5481-5"},"downloads":0},"search_terms":["intra","cell","defects","diagnosis","sun","bosio","dilillo","girard","pravossoudovich","virazel","auvray"],"keywords":[],"authorIDs":[],"dataSources":["JX8YawXbYF57PBdWQ"]}