A coarse-to-fine approach to robust 3D facial landmarking via curvature analysis and active normal model. Sun, J., Huang, D., Wang, Y., & Chen, L. In Proc. International Joint Conference on Biometrics, pages 1-8, Clearwater, FL, September 29 - October 2, 2014. IEEE. bibtex @Inproceedings{Sun_2014_16079,
author = {Sun, J. and Huang, D. and Wang, Y. and Chen, L.},
address = {Clearwater, FL},
booktitle = {Proc. International Joint Conference on Biometrics},
month = {September 29 - October 2},
pages = {1-8},
publisher = {IEEE},
title = {A coarse-to-fine approach to robust {3D} facial landmarking via curvature analysis and active normal model},
year = {2014},
language = {en},
snippets = {ijcb2014},
title_with_no_special_chars = {A CoarsetoFine Approach to Robust 3D Facial Landmarking via Curvature Analysis and Active Normal Model}
}
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