Analysis of burning probability and molten mark characteristics of wires after short circuit induced by overcurrent. Sun, Y. & Li, Y. Unknown Journal, 2021.
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Paper bibtex
Paper bibtex @article{2793,
author = {Ye Sun and Yang Li},
title = {Analysis of burning probability and molten mark characteristics of wires after short circuit induced by overcurrent},
year = {2021},
journal = {Unknown Journal},
url = {https://doi.org/10.1117/12.2620417}
}Downloads: 0
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