{"_id":"eBguBkLERJ8ADCBc8","bibbaseid":"sundaram-zeid-artificialintelligencebasedsmartqualityinspectionformanufacturing-2023","author_short":["Sundaram, S.","Zeid, A."],"bibdata":{"bibtype":"article","type":"article","title":"Artificial intelligence-based smart quality inspection for manufacturing","author":[{"propositions":[],"lastnames":["Sundaram"],"firstnames":["Sarvesh"],"suffixes":[]},{"propositions":[],"lastnames":["Zeid"],"firstnames":["Abe"],"suffixes":[]}],"journal":"Micromachines","volume":"14","number":"3","pages":"570","year":"2023","publisher":"MDPI","bibtex":"@article{sundaram2023artificial,\n title={Artificial intelligence-based smart quality inspection for manufacturing},\n author={Sundaram, Sarvesh and Zeid, Abe},\n journal={Micromachines},\n volume={14},\n number={3},\n pages={570},\n year={2023},\n publisher={MDPI}\n}\n","author_short":["Sundaram, S.","Zeid, A."],"key":"sundaram2023artificial","id":"sundaram2023artificial","bibbaseid":"sundaram-zeid-artificialintelligencebasedsmartqualityinspectionformanufacturing-2023","role":"author","urls":{},"metadata":{"authorlinks":{}},"downloads":0,"html":""},"bibtype":"article","biburl":"https://bibbase.org/network/files/8QKYpLsoHCXsuPEiY","dataSources":["YEnHacMo74cqDZMMB"],"keywords":[],"search_terms":["artificial","intelligence","based","smart","quality","inspection","manufacturing","sundaram","zeid"],"title":"Artificial intelligence-based smart quality inspection for manufacturing","year":2023}