Automated Parameter Optimization of Classification Techniques for Defect Prediction Models. Tantithamthavorn, C., McIntosh, S., Hassan, A. E., & Matsumoto, K. In Proceedings of the 38th International Conference on Software Engineering, pages 321–332, New York, NY, USA, 2016. ACM. ![Automated Parameter Optimization of Classification Techniques for Defect Prediction Models [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @inproceedings{tantithamthavorn_automated_2016,
address = {New York, NY, USA},
title = {Automated {Parameter} {Optimization} of {Classification} {Techniques} for {Defect} {Prediction} {Models}},
isbn = {978-1-4503-3900-1},
url = {http://doi.acm.org/10.1145/2884781.2884857},
doi = {10.1145/2884781.2884857},
booktitle = {Proceedings of the 38th {International} {Conference} on {Software} {Engineering}},
publisher = {ACM},
author = {Tantithamthavorn, Chakkrit and McIntosh, Shane and Hassan, Ahmed E. and Matsumoto, Kenichi},
year = {2016},
keywords = {classification techniques, experimental design, parameter optimization, software defect prediction},
pages = {321--332},
}
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