Statistical design of a D/A converter based on the current division technique. Tarim, T., Kuntman, H., & Ismail, M. In Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, volume 2, 1998.
abstract   bibtex   
© 1998 IEEE. As device sizes scale down to submicron ranges, random device/process variations happen to be more effective. This makes statistical design of low voltage circuits an essential work. D/A conversion is an essential function in data processing systems. Data conversion systems deal with analog as well as digital signals. The current division network of the D/A converter based on the current division technique is the most effective component of the circuit. The output current mismatch of the network has been studied in this paper. A choice of a certain value of aspect ratio will effect the relative current mismatch, frequency response and offset induced errors. Trade-offs between these three parameters have been given. Statistical concepts have been used in the simulations.
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 title = {Statistical design of a D/A converter based on the current division technique},
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 year = {1998},
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 abstract = {© 1998 IEEE. As device sizes scale down to submicron ranges, random device/process variations happen to be more effective. This makes statistical design of low voltage circuits an essential work. D/A conversion is an essential function in data processing systems. Data conversion systems deal with analog as well as digital signals. The current division network of the D/A converter based on the current division technique is the most effective component of the circuit. The output current mismatch of the network has been studied in this paper. A choice of a certain value of aspect ratio will effect the relative current mismatch, frequency response and offset induced errors. Trade-offs between these three parameters have been given. Statistical concepts have been used in the simulations.},
 bibtype = {inProceedings},
 author = {Tarim, T.B. and Kuntman, H.H. and Ismail, M.},
 booktitle = {Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems}
}

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