Product line models of large cyber-physical systems: the case of ERTMS/ETCS. ter Beek, M. H., Fantechi, A., & Gnesi, S. In Berger, T., Borba, P., Botterweck, G., Männistö, T., Benavides, D., Nadi, S., Kehrer, T., Rabiser, R., Elsner, C., & Mukelabai, M., editors, Proceeedings of the 22nd International Systems and Software Product Line Conference - Volume 1, SPLC 2018, Gothenburg, Sweden, September 10-14, 2018, pages 208–214, 2018. ACM.
Product line models of large cyber-physical systems: the case of ERTMS/ETCS [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/splc/BeekFG18,
    author = "ter Beek, Maurice H. and Fantechi, Alessandro and Gnesi, Stefania",
    editor = {Berger, Thorsten and Borba, Paulo and Botterweck, Goetz and M{\"{a}}nnist{\"{o}}, Tomi and Benavides, David and Nadi, Sarah and Kehrer, Timo and Rabiser, Rick and Elsner, Christoph and Mukelabai, Mukelabai},
    title = "Product line models of large cyber-physical systems: the case of {ERTMS/ETCS}",
    booktitle = "Proceeedings of the 22nd International Systems and Software Product Line Conference - Volume 1, {SPLC} 2018, Gothenburg, Sweden, September 10-14, 2018",
    pages = "208--214",
    publisher = "{ACM}",
    year = "2018",
    url = "https://doi.org/10.1145/3233027.3233046",
    doi = "10.1145/3233027.3233046",
    timestamp = "Sat, 09 Apr 2022 12:37:33 +0200",
    biburl = "https://dblp.org/rec/conf/splc/BeekFG18.bib",
    bibsource = "dblp computer science bibliography, https://dblp.org"
}

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