@Article{         ter-Maten_2016ab,
  author        = {ter Maten, E. Jan W. and Putek, Piotr A. and Günther, Michael and Pulch, Roland and Tischendorf, Caren and Strohm, Christian and Schoenmaker, Wim and Meuris, Peter and De Smedt, Bart and Benner, Peter and Feng, Lihong and Banagaaya, Nicodemus and Yue, Yao and Janssen, Rick and Dohmen, Jos J. and Tasic, Bratislav and Deleu, Frederik and Gillon, Renaud and Wieers, Renaud and Brachtendorf, Hans Georg and Bittner, Kai and Kratochvíl, Tomás and Petrzela, Jirí and Sotner, Roman and Göthans, Tomás and Drínovský, Jirí and Schöps, Sebastian and Duque, David José and Casper, Thorben and De Gersem, Herbert and Römer, Ulrich and Reynier, Pascal and Barroul, Patrice and Masliah, Denis and Rousseau, Benoît},
  citable       = {1},
  day           = {30},
  doi           = {10.1186/s13362-016-0025-5},
  file          = {ter-Maten_2016ab.pdf},
  group         = {schoeps,roemer,casper,duque,gsce},
  internal      = {0},
  issn          = {2190-5983},
  journal       = {Journal of Mathematics in Industry},
  keywords      = {nanocops,uq,semiconductor},
  langid        = {english},
  month         = jun,
  number        = {2},
  publisher     = {Springer},
  temf-id       = {2593},
  title         = {{Nanoelectronic} {COupled} {Problems} {Solutions} - {nanoCOPS}: Modelling, Multirate, Model Order Reduction, Uncertainty Quantification, Fast Fault Simulation},
  volume        = {7},
  year          = {2016},
  reviewed      = {1},
  shortjournal  = {J. Math. Ind.}
}

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