Recursive TMR: scaling fault tolerance in the nanoscale era. Thaker, D D, Amirtharajah, R, Impens, F, Chuang, I L, & Chong, F T Design & Test of Computers, IEEE, 22(4):298–305, 2005. abstract bibtex As process technologies decrease in feature size, designers face new reliability challenges. Feature sizes of less than 0.25 μm increase the risk of noise-related faults that result from electrical disturbances in the logic values held in cir.
@Article{Thaker2005,
author = {Thaker, D D and Amirtharajah, R and Impens, F and Chuang, I L and Chong, F T},
title = {Recursive TMR: scaling fault tolerance in the nanoscale era},
journal = {Design \& Test of Computers, IEEE},
volume = {22},
number = {4},
pages = {298--305},
year = {2005},
abstract = {As process technologies decrease in feature size, designers face new reliability challenges. Feature sizes of less than 0.25 \&\#x003BC;m increase the risk of noise-related faults that result from electrical disturbances in the logic values held in cir.},
location = {},
keywords = {}}
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