@article{thole_formal_2016,
	title = {Formal {Verification} throughout the {Development} of {Robust} {Systems}},
	issn = {0010-5686},
	url = {https://core.ac.uk/display/297281498?recSetID=},
	abstract = {As transistors are becomming smaller and smaller, they become more susceptible to transient faults due to radiation. A system can be modified to handle these faults and prevent errors that are visible from outside. We present a formal method for equivalence checking to verify that this modification does not change the nominal behavior of the system. On the other hand, we contribute an algorithm to formally verify that a circuit is robust against transient faults under all possible input assignments and variability. If equivalence or robustness cannot be shown, a counterexample is generated},
	language = {en-gb},
	urldate = {2021-01-27},
	author = {Thole, Niels},
	year = {2016},
	keywords = {⛔ No DOI found},
}

{"_id":"REvKq8o2SNFdPtgsK","bibbaseid":"thole-formalverificationthroughoutthedevelopmentofrobustsystems-2016","author_short":["Thole, N."],"bibdata":{"bibtype":"article","type":"article","title":"Formal Verification throughout the Development of Robust Systems","issn":"0010-5686","url":"https://core.ac.uk/display/297281498?recSetID=","abstract":"As transistors are becomming smaller and smaller, they become more susceptible to transient faults due to radiation. A system can be modified to handle these faults and prevent errors that are visible from outside. We present a formal method for equivalence checking to verify that this modification does not change the nominal behavior of the system. On the other hand, we contribute an algorithm to formally verify that a circuit is robust against transient faults under all possible input assignments and variability. If equivalence or robustness cannot be shown, a counterexample is generated","language":"en-gb","urldate":"2021-01-27","author":[{"propositions":[],"lastnames":["Thole"],"firstnames":["Niels"],"suffixes":[]}],"year":"2016","keywords":"⛔ No DOI found","bibtex":"@article{thole_formal_2016,\n\ttitle = {Formal {Verification} throughout the {Development} of {Robust} {Systems}},\n\tissn = {0010-5686},\n\turl = {https://core.ac.uk/display/297281498?recSetID=},\n\tabstract = {As transistors are becomming smaller and smaller, they become more susceptible to transient faults due to radiation. A system can be modified to handle these faults and prevent errors that are visible from outside. We present a formal method for equivalence checking to verify that this modification does not change the nominal behavior of the system. On the other hand, we contribute an algorithm to formally verify that a circuit is robust against transient faults under all possible input assignments and variability. If equivalence or robustness cannot be shown, a counterexample is generated},\n\tlanguage = {en-gb},\n\turldate = {2021-01-27},\n\tauthor = {Thole, Niels},\n\tyear = {2016},\n\tkeywords = {⛔ No DOI found},\n}\n\n","author_short":["Thole, N."],"key":"thole_formal_2016","id":"thole_formal_2016","bibbaseid":"thole-formalverificationthroughoutthedevelopmentofrobustsystems-2016","role":"author","urls":{"Paper":"https://core.ac.uk/display/297281498?recSetID="},"keyword":["⛔ No DOI found"],"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/SilverSylvester","dataSources":["YCBcQPneB9oxahSnp"],"keywords":["⛔ no doi found"],"search_terms":["formal","verification","throughout","development","robust","systems","thole"],"title":"Formal Verification throughout the Development of Robust Systems","year":2016}