@article{journals/mj/ThonkeSSRPFBKS09,
  added-at = {2020-11-06T00:00:00.000+0100},
  author = {Thonke, Klaus and Schirra, M. and Schneider, R. and Reiser, A. and Prinz, G. M. and Feneberg, Martin and Biskupek, Johannes and Kaiser, U. and Sauer, R.},
  biburl = {https://www.bibsonomy.org/bibtex/22c72ce39f0c5ca93d3d88dcedd9d186c/dblp},
  ee = {https://doi.org/10.1016/j.mejo.2008.07.031},
  interhash = {fcad03ddbc8a292a5534f71180b8c98e},
  intrahash = {2c72ce39f0c5ca93d3d88dcedd9d186c},
  journal = {Microelectron. J.},
  keywords = {dblp},
  number = 2,
  pages = {210-214},
  timestamp = {2020-11-07T11:34:55.000+0100},
  title = {The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures.},
  url = {http://dblp.uni-trier.de/db/journals/mj/mj40.html#ThonkeSSRPFBKS09},
  volume = 40,
  year = 2009
}

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