Fast best-effort pattern matching in large attributed graphs. Tong, H., Faloutsos, C., Gallagher, B., & Eliassi-Rad, T. In Berkhin, P., Caruana, R., & Wu, X., editors, Proceedings of the 13th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, San Jose, California, USA, August 12-15, 2007, pages 737–746, 2007. ACM.
Paper doi bibtex @inproceedings{DBLP:conf/kdd/TongFGE07,
author = {Hanghang Tong and
Christos Faloutsos and
Brian Gallagher and
Tina Eliassi{-}Rad},
editor = {Pavel Berkhin and
Rich Caruana and
Xindong Wu},
title = {Fast best-effort pattern matching in large attributed graphs},
booktitle = {Proceedings of the 13th {ACM} {SIGKDD} International Conference on
Knowledge Discovery and Data Mining, San Jose, California, USA, August
12-15, 2007},
pages = {737--746},
publisher = {{ACM}},
year = {2007},
url = {https://doi.org/10.1145/1281192.1281271},
doi = {10.1145/1281192.1281271},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/kdd/TongFGE07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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