Fast best-effort pattern matching in large attributed graphs. Tong, H., Faloutsos, C., Gallagher, B., & Eliassi-Rad, T. In Berkhin, P., Caruana, R., & Wu, X., editors, Proceedings of the 13th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, San Jose, California, USA, August 12-15, 2007, pages 737–746, 2007. ACM.
Fast best-effort pattern matching in large attributed graphs [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/kdd/TongFGE07,
  author       = {Hanghang Tong and
                  Christos Faloutsos and
                  Brian Gallagher and
                  Tina Eliassi{-}Rad},
  editor       = {Pavel Berkhin and
                  Rich Caruana and
                  Xindong Wu},
  title        = {Fast best-effort pattern matching in large attributed graphs},
  booktitle    = {Proceedings of the 13th {ACM} {SIGKDD} International Conference on
                  Knowledge Discovery and Data Mining, San Jose, California, USA, August
                  12-15, 2007},
  pages        = {737--746},
  publisher    = {{ACM}},
  year         = {2007},
  url          = {https://doi.org/10.1145/1281192.1281271},
  doi          = {10.1145/1281192.1281271},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/kdd/TongFGE07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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