{"_id":"mfjakNpDTbfte9Sgo","bibbaseid":"truesdell-calhoun-a640pw22pjsamplegateleakagebaseddigitalcmostemperaturesensorwith025cresolution-2019","author_short":["Truesdell, D. S.","Calhoun, B. H."],"bibdata":{"bibtype":"article","type":"article","author":[{"firstnames":["Daniel","S."],"propositions":[],"lastnames":["Truesdell"],"suffixes":[]},{"firstnames":["Benton","H."],"propositions":[],"lastnames":["Calhoun"],"suffixes":[]}],"title":"A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution","year":"2019","journal":"Unknown Journal","url":"https://doi.org/10.1109/cicc.2019.8780382","bibtex":"@article{581,\n author = {Daniel S. Truesdell and Benton H. Calhoun},\n title = {A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution},\n year = {2019},\n journal = {Unknown Journal},\n url = {https://doi.org/10.1109/cicc.2019.8780382}\n}\n\n","author_short":["Truesdell, D. S.","Calhoun, B. H."],"key":"581","id":"581","bibbaseid":"truesdell-calhoun-a640pw22pjsamplegateleakagebaseddigitalcmostemperaturesensorwith025cresolution-2019","role":"author","urls":{"Paper":"https://doi.org/10.1109/cicc.2019.8780382"},"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://bibbase.org/f/fFERMKNwKyHLsDPJ3/Link_Lab_Publications.bib","dataSources":["GXL8BuKffZ6XGRvhu","zTwdZBrCqogZ6yMmD","A9Zuq8B85Rd3bHeNs","zq8E4CA9zBjkA2p7P","b7zvHnuSqhTvwNoon","BE493TFz6wWiE9NkC","BT3X3GwZkCpNDfran","6CYcgzsh5rhZhtcXe","wjuM2yjE6FYvwqbTY","DesgNCELw9F4LSokr","WCSuxR2upo4FXxxRm","JSGNr3KwokFPgXiz5","RbCkvcfqfbgtxTyNT","mwAui9iKniQyhTc49","YgvS53ZWNjFkrzNS4","PbrtYBE4kqkc5ZtpJ"],"keywords":[],"search_terms":["640","sample","gate","leakage","based","digital","cmos","temperature","sensor","resolution","truesdell","calhoun"],"title":"A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution","year":2019}