On the relative value of cross-company and within-company data for defect prediction. Turhan, B., Menzies, T., Bener, A. B., & Stefano, J. S. D. Empir. Softw. Eng., 14(5):540–578, 2009.
On the relative value of cross-company and within-company data for defect prediction [link]Paper  doi  bibtex   
@article{DBLP:journals/ese/TurhanMBS09,
  author    = {Burak Turhan and
               Tim Menzies and
               Ayse Basar Bener and
               Justin S. Di Stefano},
  title     = {On the relative value of cross-company and within-company data for
               defect prediction},
  journal   = {Empir. Softw. Eng.},
  volume    = {14},
  number    = {5},
  pages     = {540--578},
  year      = {2009},
  url       = {https://doi.org/10.1007/s10664-008-9103-7},
  doi       = {10.1007/s10664-008-9103-7},
  timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ese/TurhanMBS09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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