On the relative value of cross-company and within-company data for defect prediction. Turhan, B., Menzies, T., Bener, A. B., & Stefano, J. S. D. Empir. Softw. Eng., 14(5):540–578, 2009. Paper doi bibtex @article{DBLP:journals/ese/TurhanMBS09,
author = {Burak Turhan and
Tim Menzies and
Ayse Basar Bener and
Justin S. Di Stefano},
title = {On the relative value of cross-company and within-company data for
defect prediction},
journal = {Empir. Softw. Eng.},
volume = {14},
number = {5},
pages = {540--578},
year = {2009},
url = {https://doi.org/10.1007/s10664-008-9103-7},
doi = {10.1007/s10664-008-9103-7},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ese/TurhanMBS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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