The Relation between Bug Fix Change Patterns and Change Impact Analysis. Ufuktepe, E., Tuglular, T., & Palaniappan, K. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021, pages 1089–1099, 2021. IEEE.
The Relation between Bug Fix Change Patterns and Change Impact Analysis [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/qrs/UfuktepeTP21,
  author       = {Ekincan Ufuktepe and
                  Tugkan Tuglular and
                  Kannappan Palaniappan},
  title        = {The Relation between Bug Fix Change Patterns and Change Impact Analysis},
  booktitle    = {21st {IEEE} International Conference on Software Quality, Reliability
                  and Security, {QRS} 2021, Hainan, China, December 6-10, 2021},
  pages        = {1089--1099},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/QRS54544.2021.00117},
  doi          = {10.1109/QRS54544.2021.00117},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/qrs/UfuktepeTP21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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