The Relation between Bug Fix Change Patterns and Change Impact Analysis. Ufuktepe, E., Tuglular, T., & Palaniappan, K. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021, pages 1089–1099, 2021. IEEE. Paper doi bibtex @inproceedings{DBLP:conf/qrs/UfuktepeTP21,
author = {Ekincan Ufuktepe and
Tugkan Tuglular and
Kannappan Palaniappan},
title = {The Relation between Bug Fix Change Patterns and Change Impact Analysis},
booktitle = {21st {IEEE} International Conference on Software Quality, Reliability
and Security, {QRS} 2021, Hainan, China, December 6-10, 2021},
pages = {1089--1099},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/QRS54544.2021.00117},
doi = {10.1109/QRS54544.2021.00117},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/qrs/UfuktepeTP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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{"_id":"KW23uHQcpkjGjmAKw","bibbaseid":"ufuktepe-tuglular-palaniappan-therelationbetweenbugfixchangepatternsandchangeimpactanalysis-2021","author_short":["Ufuktepe, E.","Tuglular, T.","Palaniappan, K."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"firstnames":["Ekincan"],"propositions":[],"lastnames":["Ufuktepe"],"suffixes":[]},{"firstnames":["Tugkan"],"propositions":[],"lastnames":["Tuglular"],"suffixes":[]},{"firstnames":["Kannappan"],"propositions":[],"lastnames":["Palaniappan"],"suffixes":[]}],"title":"The Relation between Bug Fix Change Patterns and Change Impact Analysis","booktitle":"21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021","pages":"1089–1099","publisher":"IEEE","year":"2021","url":"https://doi.org/10.1109/QRS54544.2021.00117","doi":"10.1109/QRS54544.2021.00117","timestamp":"Sat, 30 Sep 2023 01:00:00 +0200","biburl":"https://dblp.org/rec/conf/qrs/UfuktepeTP21.bib","bibsource":"dblp computer science bibliography, https://dblp.org","bibtex":"@inproceedings{DBLP:conf/qrs/UfuktepeTP21,\n author = {Ekincan Ufuktepe and\n Tugkan Tuglular and\n Kannappan Palaniappan},\n title = {The Relation between Bug Fix Change Patterns and Change Impact Analysis},\n booktitle = {21st {IEEE} International Conference on Software Quality, Reliability\n and Security, {QRS} 2021, Hainan, China, December 6-10, 2021},\n pages = {1089--1099},\n publisher = {{IEEE}},\n year = {2021},\n url = {https://doi.org/10.1109/QRS54544.2021.00117},\n doi = {10.1109/QRS54544.2021.00117},\n timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},\n biburl = {https://dblp.org/rec/conf/qrs/UfuktepeTP21.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","author_short":["Ufuktepe, E.","Tuglular, T.","Palaniappan, K."],"key":"DBLP:conf/qrs/UfuktepeTP21","id":"DBLP:conf/qrs/UfuktepeTP21","bibbaseid":"ufuktepe-tuglular-palaniappan-therelationbetweenbugfixchangepatternsandchangeimpactanalysis-2021","role":"author","urls":{"Paper":"https://doi.org/10.1109/QRS54544.2021.00117"},"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://dblp.org/pid/21/700.bib","dataSources":["fTpoadWdPkK6gsAHp","5gsSy8t2N8vv4G2Ad","GA8cFNQ4AbbchzoRr"],"keywords":[],"search_terms":["relation","between","bug","fix","change","patterns","change","impact","analysis","ufuktepe","tuglular","palaniappan"],"title":"The Relation between Bug Fix Change Patterns and Change Impact Analysis","year":2021}