Probabilistic Analysis of Power and Temperature Under Process Variation for Electronic System Design. Ukhov, I., Eles, P., & Peng, Z. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(6):931-944, 2014.
Probabilistic Analysis of Power and Temperature Under Process Variation for Electronic System Design. [link]Link  Probabilistic Analysis of Power and Temperature Under Process Variation for Electronic System Design. [link]Paper  bibtex   
@article{ journals/tcad/UkhovEP14,
  added-at = {2014-05-21T00:00:00.000+0200},
  author = {Ukhov, Ivan and Eles, Petru and Peng, Zebo},
  biburl = {http://www.bibsonomy.org/bibtex/282577fdbe7245cee4afefb2dfa3c78b4/dblp},
  ee = {http://dx.doi.org/10.1109/TCAD.2014.2301672},
  interhash = {7ef00821135f07f53595fb84a0c6cea1},
  intrahash = {82577fdbe7245cee4afefb2dfa3c78b4},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  keywords = {dblp},
  number = {6},
  pages = {931-944},
  title = {Probabilistic Analysis of Power and Temperature Under Process Variation for Electronic System Design.},
  url = {http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#UkhovEP14},
  volume = {33},
  year = {2014}
}

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