NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors

NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors. van Zandwijk, J. P. & Fukami, A. IEEE Secur. Priv., 15(6):82–87, 2017.

Paper doi bibtex

@article{DBLP:journals/ieeesp/ZandwijkF17,
  author    = {Jan Peter van Zandwijk and
               Aya Fukami},
  title     = {{NAND} Flash Memory Forensic Analysis and the Growing Challenge of
               Bit Errors},
  journal   = {{IEEE} Secur. Priv.},
  volume    = {15},
  number    = {6},
  pages     = {82--87},
  year      = {2017},
  url       = {https://doi.org/10.1109/MSP.2017.4251114},
  doi       = {10.1109/MSP.2017.4251114},
  timestamp = {Sun, 15 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/ieeesp/ZandwijkF17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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