@inproceedings{DBLP:conf/iolts/VargasAV00,
  author       = {Fabian Vargas and
                  Alexandre M. Amory and
                  Raoul Velazco},
  title        = {Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection
                  in {VHDL}},
  booktitle    = {6th {IEEE} International On-Line Testing Workshop {(IOLTW} 2000),
                  3-5 July 2000, Palma de Mallorca, Spain},
  pages        = {67--72},
  year         = {2000},
  crossref     = {DBLP:conf/iolts/2000},
  url          = {https://doi.org/10.1109/OLT.2000.856614},
  doi          = {10.1109/OLT.2000.856614},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/VargasAV00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

{"_id":"gfnhcbNXCvvrzsdPQ","bibbaseid":"vargas-amory-velazco-estimatingcircuitfaulttolerancebymeansoftransientfaultinjectioninvhdl-2000","downloads":0,"creationDate":"2016-08-26T18:21:53.522Z","title":"Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL","author_short":["Vargas, F.","Amory, A. M.","Velazco, R."],"year":2000,"bibtype":"inproceedings","biburl":"http://dblp.dagstuhl.de/pers/tb2/a/Amory:Alexandre_M=.bib","bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"firstnames":["Fabian"],"propositions":[],"lastnames":["Vargas"],"suffixes":[]},{"firstnames":["Alexandre","M."],"propositions":[],"lastnames":["Amory"],"suffixes":[]},{"firstnames":["Raoul"],"propositions":[],"lastnames":["Velazco"],"suffixes":[]}],"title":"Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL","booktitle":"6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain","pages":"67–72","year":"2000","crossref":"DBLP:conf/iolts/2000","url":"https://doi.org/10.1109/OLT.2000.856614","doi":"10.1109/OLT.2000.856614","timestamp":"Thu, 23 Mar 2023 00:00:00 +0100","biburl":"https://dblp.org/rec/conf/iolts/VargasAV00.bib","bibsource":"dblp computer science bibliography, https://dblp.org","bibtex":"@inproceedings{DBLP:conf/iolts/VargasAV00,\n author = {Fabian Vargas and\n Alexandre M. Amory and\n Raoul Velazco},\n title = {Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection\n in {VHDL}},\n booktitle = {6th {IEEE} International On-Line Testing Workshop {(IOLTW} 2000),\n 3-5 July 2000, Palma de Mallorca, Spain},\n pages = {67--72},\n year = {2000},\n crossref = {DBLP:conf/iolts/2000},\n url = {https://doi.org/10.1109/OLT.2000.856614},\n doi = {10.1109/OLT.2000.856614},\n timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},\n biburl = {https://dblp.org/rec/conf/iolts/VargasAV00.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","author_short":["Vargas, F.","Amory, A. M.","Velazco, R."],"key":"DBLP:conf/iolts/VargasAV00","id":"DBLP:conf/iolts/VargasAV00","bibbaseid":"vargas-amory-velazco-estimatingcircuitfaulttolerancebymeansoftransientfaultinjectioninvhdl-2000","role":"author","urls":{"Paper":"https://doi.org/10.1109/OLT.2000.856614"},"metadata":{"authorlinks":{"amory, a":"https://amamory.github.io/research/pub.html"}},"downloads":0,"html":""},"search_terms":["estimating","circuit","fault","tolerance","means","transient","fault","injection","vhdl","vargas","amory","velazco"],"keywords":[],"authorIDs":["57c091645abfdd4d54000320","NPvGiXycNumKM5EF4"],"dataSources":["iPiqqxPye3Nc7QBGs","zyfHk33kC8cfNu3vx","ZnKvBZN9FDvFao2cx","WSHz5SBkJZfKc2YAB","CZjH9DaszPZg8XTvs"]}