Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films. Vetushka, A., Fejfar, A., Ledinský, M., Rezek, B., Stuchlík, J., & Kočka, J. In Utrecht, 2009.
bibtex   
@inproceedings{ vetushka_role_2009,
  address = {Utrecht},
  title = {Role of the tip induced local anodic
oxidation in the conductive atomic
force microscopy of mixed phase
silicon thin films},
  author = {Vetushka, Aliaksei and Fejfar, Antonín and Ledinský, Martin and Rezek, Bohuslav and Stuchlík, Jiří and Kočka, Jan},
  year = {2009}
}

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