@article{ dblp2799474,
  title = {Is triple modular redundancy suitable for yield improvement?},
  author = {Julien Vial and Arnaud Virazel and Alberto Bosio and Patrick Girard and Christian Landrault and Serge Pravossoudovitch},
  author_short = {Vial, J. and Virazel, A. and Bosio, A. and Girard, P. and Landrault, C. and Pravossoudovitch, S.},
  bibtype = {article},
  type = {article},
  year = {2009},
  key = {dblp2799474},
  id = {dblp2799474},
  biburl = {http://www.dblp.org/rec/bibtex/journals/iet-cdt/VialVBGLP09},
  url = {http://dx.doi.org/10.1049/iet-cdt.2008.0127},
  journal = {IET Computers & Digital Techniques (IET-CDT)},
  pages = {581-592},
  number = {6},
  volume = {3},
  text = {IET Computers & Digital Techniques (IET-CDT) 3(6):581-592 (2009)}
}

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