Implementation of stable PUFs using gate oxide breakdown. Wang, W., Yona, Y., Wu, Y., Hung, S., Diggavi, S., & Gupta, P. In 2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST), pages 13–18, 2017. IEEE.
bibtex   
@inproceedings{wang2017implementation,
 author = {Wang, Wei-Che and Yona, Yair and Wu, Yizhang and Hung, Szu-Yao and Diggavi, Suhas and Gupta, Puneet},
 booktitle = {2017 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)},
 organization = {IEEE},
 pages = {13--18},
 tags = {conf,HS},
 title = {Implementation of stable PUFs using gate oxide breakdown},
 type = {4},
 year = {2017}
}

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