Understanding and Fixing Complex Faults in Embedded Cyberphysical Systems. Weiss, A., Gautham, S., Jayakumar, A. V., Elks, C., Kuhn, D. R., Kacker, R. N., & Preusser, T. B. Computer, 54(1):49–60, January, 2021. arXiv: 2102.03420
Paper doi abstract bibtex 15 downloads Understanding fault types can lead to novel approaches to debugging and runtime verification. Dealing with complex faults, particularly in the challenging area of embedded systems, craves for more powerful tools, which are now becoming available to engineers.
@article{weiss_understanding_2021,
title = {Understanding and {Fixing} {Complex} {Faults} in {Embedded} {Cyberphysical} {Systems}},
volume = {54},
issn = {0018-9162, 1558-0814},
url = {http://arxiv.org/abs/2102.03420},
doi = {10.1109/MC.2020.3029975},
abstract = {Understanding fault types can lead to novel approaches to debugging and runtime verification. Dealing with complex faults, particularly in the challenging area of embedded systems, craves for more powerful tools, which are now becoming available to engineers.},
number = {1},
urldate = {2021-02-09},
journal = {Computer},
author = {Weiss, Alexander and Gautham, Smitha and Jayakumar, Athira Varma and Elks, Carl and Kuhn, D. Richard and Kacker, Raghu N. and Preusser, Thomas B.},
month = jan,
year = {2021},
note = {arXiv: 2102.03420},
keywords = {Computer Science - Software Engineering},
pages = {49--60},
}
Downloads: 15
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