Elastic Scattering. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 39–51. Springer US, Boston, MA, 2009. Paper doi abstract bibtex Elastically scattered electrons are the major source of contrast in TEM images. They also create much of the intensity in DPs, so we need to understand what controls this process. First we’ll consider elastic scattering from single, isolated atoms and then from many atoms together in the specimen. To comprehend elastic scattering we need to invoke both particle and wave characteristics of electrons.
@incollection{williams_elastic_2009,
address = {Boston, MA},
title = {Elastic {Scattering}},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_3},
abstract = {Elastically scattered electrons are the major source of contrast in TEM images. They also create much of the intensity in DPs, so we need to understand what controls this process. First we’ll consider elastic scattering from single, isolated atoms and then from many atoms together in the specimen. To comprehend elastic scattering we need to invoke both particle and wave characteristics of electrons.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_3},
keywords = {Atomic Plane, Diffract Beam, Elastic Scattering, Electron Cloud, Scatter Cross Section},
pages = {39--51},
}
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