Electron Energy-Loss Spectrometers and Filters. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 679–698. Springer US, Boston, MA, 2009.
Paper doi abstract bibtex Electron energy-loss spectrometry (EELS) is the analysis of the energy distribution of electrons that have come through the specimen. These electrons may have lost no energy or may have suffered inelastic (usually electron-electron) collisions.
@incollection{williams_electron_2009,
address = {Boston, MA},
title = {Electron {Energy}-{Loss} {Spectrometers} and {Filters}},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_37},
abstract = {Electron energy-loss spectrometry (EELS) is the analysis of the energy distribution of electrons that have come through the specimen. These electrons may have lost no energy or may have suffered inelastic (usually electron-electron) collisions.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_37},
keywords = {Chromatic Aberration, Energy Resolution, Entrance Aperture, Objective Aperture, Projector Lens},
pages = {679--698},
}
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