High Energy-Loss Spectra and Images

High Energy-Loss Spectra and Images. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 715–739. Springer US, Boston, MA, 2009.

Paper doi abstract bibtex

The high energy-loss spectrum (E\textgreater50 eV) consists primarily of ionization or core-loss edges on a rapidly decreasing plural-scattering background. Elemental-composition data and elemental maps can be extracted from these ionization edges. In this chapter, we’ll examine how to get this information, quantify it, and image it. A good use for such data is lightelement analysis wherein EELS complements XEDS. First, we’ll remind you of the experimental variables over which you have control, because these are rather critical. Then we’ll discuss how to obtain a spectrum and what it should look like if you’re going to quantify it.

@incollection{williams_high_2009,
	address = {Boston, MA},
	title = {High {Energy}-{Loss} {Spectra} and {Images}},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_39},
	abstract = {The high energy-loss spectrum (E{\textgreater}50 eV) consists primarily of ionization or core-loss edges on a rapidly decreasing plural-scattering background. Elemental-composition data and elemental maps can be extracted from these ionization edges. In this chapter, we’ll examine how to get this information, quantify it, and image it. A good use for such data is lightelement analysis wherein EELS complements XEDS. First, we’ll remind you of the experimental variables over which you have control, because these are rather critical. Then we’ll discuss how to obtain a spectrum and what it should look like if you’re going to quantify it.},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_39},
	keywords = {Collection Angle, Convergence Angle, Edge Integration, Edge Intensity, Ionization Cross Section},
	pages = {715--739},
}

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