Image Simulation

Image Simulation. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, volume 30, pages 533–548. Springer US, Boston, MA, 2009.

Paper doi abstract bibtex

When we need to obtain information about the specimen in two directions, we need to align the specimen close to a low-index zone axis. If theHRTEMimage information is going to be directly interpretable, the specimen must be oriented with the incident beam exactly aligned with both the optic axis of the TEM and the zone axis of the specimen. Thus, we will have many reflections excited and the simple two-beam analysis of Chapter 27 cannot be used.

@incollection{williams_image_2009,
	address = {Boston, MA},
	title = {Image {Simulation}},
	volume = {30},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_30},
	abstract = {When we need to obtain information about the specimen in two directions, we need to align the specimen close to a low-index zone axis. If theHRTEMimage information is going to be directly interpretable, the specimen must be oriented with the incident beam exactly aligned with both the optic axis of the TEM and the zone axis of the specimen. Thus, we will have many reflections excited and the simple two-beam analysis of Chapter 27 cannot be used.},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_30},
	keywords = {Bloch Wave, Fringe Spacing, HRTEM Image, High Resolution Electron Microscopy, Image Simulation},
	pages = {533--548},
}

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