Lenses, Apertures, and Resolution

Lenses, Apertures, and Resolution. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 91–114. Springer US, Boston, MA, 2009.

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Electron lenses are the TEM’s equivalent of the glass lenses in a visible light microscope (VLM) and, to a large extent, we can draw comparisons between the two. For example, the behavior of all the lenses in a standard TEM can be approximated to the action of a convex (converging) glass lens on monochromatic light. The lens is basically used to do two things ■ Take all the rays emanating from a point in an object and recreate a point in an image ■ Focus parallel rays to a point in the focal plane of the lens

@incollection{williams_lenses_2009,
	address = {Boston, MA},
	title = {Lenses, {Apertures}, and {Resolution}},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_6},
	abstract = {Electron lenses are the TEM’s equivalent of the glass lenses in a visible light microscope (VLM) and, to a large extent, we can draw comparisons between the two. For example, the behavior of all the lenses in a standard TEM can be approximated to the action of a convex (converging) glass lens on monochromatic light. The lens is basically used to do two things ■ Take all the rays emanating from a point in an object and recreate a point in an image ■ Focus parallel rays to a point in the focal plane of the lens},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_6},
	keywords = {Chromatic Aberration, Electron Lens, Gaussian Image, Object Plane, Spherical Aberration},
	pages = {91--114},
}

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