Low-Loss and No-Loss Spectra and Images

Low-Loss and No-Loss Spectra and Images. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 699–713. Springer US, Boston, MA, 2009.

Paper doi abstract bibtex

The term ‘energy loss’ implies that we are interested only in inelastic interactions, but the spectrum will also contain electrons which have not lost any discernible energy, so we need to consider elastic scattering as well. In this chapter, we’ll focus on the low-energy portion of the EEL spectrum which comprises.

@incollection{williams_low-loss_2009,
	address = {Boston, MA},
	title = {Low-{Loss} and {No}-{Loss} {Spectra} and {Images}},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_38},
	abstract = {The term ‘energy loss’ implies that we are interested only in inelastic interactions, but the spectrum will also contain electrons which have not lost any discernible energy, so we need to consider elastic scattering as well. In this chapter, we’ll focus on the low-energy portion of the EEL spectrum which comprises.},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_38},
	keywords = {Interband Transition, Plasmon Loss, Plasmon Peak, Thick Specimen, Thin Specimen},
	pages = {699--713},
}

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