Obtaining and Indexing Parallel-Beam Diffraction Patterns. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 283–309. Springer US, Boston, MA, 2009.
Paper doi abstract bibtex The core strength ofTEMis that you can obtain both a DP and an image from the same part of your specimen (not to mention various spectra). To obtain the crystallographic data, a method for interpreting and indexing the DP is essential and this aspect is the theme for the next four chapters. We’ll start in this chapter by considering classic selected-area diffraction (SAD) patterns (SADPs) and how to index them, but also introduce other related, if less widely used, parallel-beam diffraction methods.
@incollection{williams_obtaining_2009-1,
address = {Boston, MA},
title = {Obtaining and {Indexing} {Parallel}-{Beam} {Diffraction} {Patterns}},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_18},
abstract = {The core strength ofTEMis that you can obtain both a DP and an image from the same part of your specimen (not to mention various spectra). To obtain the crystallographic data, a method for interpreting and indexing the DP is essential and this aspect is the theme for the next four chapters. We’ll start in this chapter by considering classic selected-area diffraction (SAD) patterns (SADPs) and how to index them, but also introduce other related, if less widely used, parallel-beam diffraction methods.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_18},
keywords = {Amorphous Material, Great Circle, Orientation Relationship, Reciprocal Lattice, Stereographic Projection},
pages = {283--309},
}
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