@incollection{williams_obtaining_2009,
	address = {Boston, MA},
	title = {Obtaining {CBED} {Patterns}},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_20},
	abstract = {We know that SAD, while giving us useful information about the specimen, has two severe limitations.},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_20},
	keywords = {Convergence Angle, Convergent Beam Electron Diffraction, Objective Lens, Thick Specimen, Thin Specimen},
	pages = {323--345},
}

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