Other Imaging Techniques. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 511–532. Springer US, Boston, MA, 2009. ![Other Imaging Techniques [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex Much of what we’ve discussed in the preceding imaging chapters is what we might call ‘classical’ TEM imaging. It began with BF and DF techniques and quickly expanded to include many beams. Diffraction contrast, phase contrast, and to a lesser extent, mass-thickness contrast are the mechanisms we use to characterize our specimens. We control the contrast by inserting the objective aperture, or a STEM detector, and excluding or collecting electrons that have been scattered by the different processes. However, there are variations to the standard ways in whichwe can extractmore information from aTEMimage; in this chapter, we’ll present a brief overview of some of them. Most of these operational modes that we’ll discuss here are somewhat esoteric and have rather specialized applications. Nevertheless, you should know that they exist because they may be just what you need to solve your particular problem.
@incollection{williams_other_2009-1,
address = {Boston, MA},
title = {Other {Imaging} {Techniques}},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_29},
abstract = {Much of what we’ve discussed in the preceding imaging chapters is what we might call ‘classical’ TEM imaging. It began with BF and DF techniques and quickly expanded to include many beams. Diffraction contrast, phase contrast, and to a lesser extent, mass-thickness contrast are the mechanisms we use to characterize our specimens. We control the contrast by inserting the objective aperture, or a STEM detector, and excluding or collecting electrons that have been scattered by the different processes. However, there are variations to the standard ways in whichwe can extractmore information from aTEMimage; in this chapter, we’ll present a brief overview of some of them. Most of these operational modes that we’ll discuss here are somewhat esoteric and have rather specialized applications. Nevertheless, you should know that they exist because they may be just what you need to solve your particular problem.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_29},
keywords = {Flux Line, Objective Aperture, Objective Lens, Stem Image, Thin Specimen},
pages = {511--532},
}
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{"_id":"XnmmegvL84sWSZKQj","bibbaseid":"williams-carter-otherimagingtechniques-2009","author_short":["Williams, D. B.","Carter, C. B."],"bibdata":{"bibtype":"incollection","type":"incollection","address":"Boston, MA","title":"Other Imaging Techniques","isbn":"978-0-387-76501-3","url":"https://doi.org/10.1007/978-0-387-76501-3_29","abstract":"Much of what we’ve discussed in the preceding imaging chapters is what we might call ‘classical’ TEM imaging. It began with BF and DF techniques and quickly expanded to include many beams. Diffraction contrast, phase contrast, and to a lesser extent, mass-thickness contrast are the mechanisms we use to characterize our specimens. We control the contrast by inserting the objective aperture, or a STEM detector, and excluding or collecting electrons that have been scattered by the different processes. However, there are variations to the standard ways in whichwe can extractmore information from aTEMimage; in this chapter, we’ll present a brief overview of some of them. Most of these operational modes that we’ll discuss here are somewhat esoteric and have rather specialized applications. Nevertheless, you should know that they exist because they may be just what you need to solve your particular problem.","language":"en","urldate":"2021-09-02","booktitle":"Transmission Electron Microscopy: A Textbook for Materials Science","publisher":"Springer US","author":[{"propositions":[],"lastnames":["Williams"],"firstnames":["David","B."],"suffixes":[]},{"propositions":[],"lastnames":["Carter"],"firstnames":["C.","Barry"],"suffixes":[]}],"editor":[{"propositions":[],"lastnames":["Williams"],"firstnames":["David","B."],"suffixes":[]},{"propositions":[],"lastnames":["Carter"],"firstnames":["C.","Barry"],"suffixes":[]}],"year":"2009","doi":"10.1007/978-0-387-76501-3_29","keywords":"Flux Line, Objective Aperture, Objective Lens, Stem Image, Thin Specimen","pages":"511–532","bibtex":"@incollection{williams_other_2009-1,\n\taddress = {Boston, MA},\n\ttitle = {Other {Imaging} {Techniques}},\n\tisbn = {978-0-387-76501-3},\n\turl = {https://doi.org/10.1007/978-0-387-76501-3_29},\n\tabstract = {Much of what we’ve discussed in the preceding imaging chapters is what we might call ‘classical’ TEM imaging. It began with BF and DF techniques and quickly expanded to include many beams. Diffraction contrast, phase contrast, and to a lesser extent, mass-thickness contrast are the mechanisms we use to characterize our specimens. We control the contrast by inserting the objective aperture, or a STEM detector, and excluding or collecting electrons that have been scattered by the different processes. However, there are variations to the standard ways in whichwe can extractmore information from aTEMimage; in this chapter, we’ll present a brief overview of some of them. Most of these operational modes that we’ll discuss here are somewhat esoteric and have rather specialized applications. Nevertheless, you should know that they exist because they may be just what you need to solve your particular problem.},\n\tlanguage = {en},\n\turldate = {2021-09-02},\n\tbooktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},\n\tpublisher = {Springer US},\n\tauthor = {Williams, David B. and Carter, C. Barry},\n\teditor = {Williams, David B. and Carter, C. Barry},\n\tyear = {2009},\n\tdoi = {10.1007/978-0-387-76501-3_29},\n\tkeywords = {Flux Line, Objective Aperture, Objective Lens, Stem Image, Thin Specimen},\n\tpages = {511--532},\n}\n\n","author_short":["Williams, D. B.","Carter, C. B."],"editor_short":["Williams, D. B.","Carter, C. B."],"key":"williams_other_2009-1","id":"williams_other_2009-1","bibbaseid":"williams-carter-otherimagingtechniques-2009","role":"author","urls":{"Paper":"https://doi.org/10.1007/978-0-387-76501-3_29"},"keyword":["Flux Line","Objective Aperture","Objective Lens","Stem Image","Thin Specimen"],"metadata":{"authorlinks":{}},"html":""},"bibtype":"incollection","biburl":"https://bibbase.org/zotero/spintextures","dataSources":["rx3H6duFmTt3xD5yy","rXHvWQJHcL8ctHS4s"],"keywords":["flux line","objective aperture","objective lens","stem image","thin specimen"],"search_terms":["imaging","techniques","williams","carter"],"title":"Other Imaging Techniques","year":2009}