Phase-Contrast Images. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, volume 23, pages 389–405. Springer US, Boston, MA, 2009. Paper doi abstract bibtex We see phase contrast any time we have more than one beam contributing to the image. In fact, whenever we say “fringes,” we are essentially referring to a phase-contrast phenomenon. Although we often distinguish phase and diffraction contrast, this distinction is generally artificial. For example, in Chapters 24 and 25, we will examine thickness fringes and stackingfault fringes; both types of contrast result from interference of waves so both are phasecontrast images although we usually think of them as two-beam, diffraction-contrast images.
@incollection{williams_phase-contrast_2009,
address = {Boston, MA},
title = {Phase-{Contrast} {Images}},
volume = {23},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_23},
abstract = {We see phase contrast any time we have more than one beam contributing to the image. In fact, whenever we say “fringes,” we are essentially referring to a phase-contrast phenomenon. Although we often distinguish phase and diffraction contrast, this distinction is generally artificial. For example, in Chapters 24 and 25, we will examine thickness fringes and stackingfault fringes; both types of contrast result from interference of waves so both are phasecontrast images although we usually think of them as two-beam, diffraction-contrast images.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_23},
keywords = {Burger Vector, Fringe Spacing, Lattice Plane, Objective Aperture, Objective Lens},
pages = {389--405},
}
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