@incollection{williams_planar_2009,
	address = {Boston, MA},
	title = {Planar {Defects}},
	volume = {25},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_25},
	abstract = {Internal interfaces (grain boundaries, phase boundaries, stacking faults) or external interfaces (i.e., surfaces) are surely the most important defects in crystalline engineering materials. Their common feature is that we can usually think of them as all being two-dimensional, or planar, defects (even though they’re not really). The main topics of this chapter will be ■ Characterizing which type of internal interface we have and determining its main parameters. ■ Identifying lattice translations at these interfaces from the appearance of the diffractioncontrast images.},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_25},
	keywords = {Bloch Wave, Diffraction Contrast, Dispersion Surface, Ewald Sphere, Planar Defect},
	pages = {419--439},
}

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