@incollection{williams_instrument_2009,
	address = {Boston, MA},
	title = {The {Instrument}},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_9},
	abstract = {Over the preceding four chapters we’ve now introduced all the essential components of the TEM and it’s time to see how the guns (Chapter 5), lenses (Chapter 6), detectors/screens (Chapter 7), and specimen holders (Chapter 8) are combined to form the instrument. Just as we do for the VLM, it’s convenient to divide up the TEM into three components: the illumination system, the objective lens/stage, and the imaging system. The illumination system comprises the gun and the condenser lenses and its role is to take the electrons from the source and transfer them to your specimen. You can operate the illumination system in two principal modes: parallel beam and convergent beam. The first mode is used primarily for TEM imaging and selected-area diffraction (SAD), while the second is used mainly for scanning (STEM) imaging, analysis via X-ray and electron spectrometry, and convergentbeam electron diffraction (CBED).},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_9},
	keywords = {Illumination System, Objective Lens, Parallel Beam, Stem Image, Transmission Electron Microscope},
	pages = {141--171},
}

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