The Transmission Electron Microscope. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 3–22. Springer US, Boston, MA, 2009.
The Transmission Electron Microscope [link]Paper  doi  abstract   bibtex   
A typical commercial transmission electron microscope (TEM) costs about $5 for each electron volt (eV) of energy in the beam and, if you add on all available options, it can easily cost up to $10 per eV. As you’ll see, we use beam energies in the range from 100,000 to 400,000 eV, so a TEMis an extremely expensive piece of equipment. Consequently, there have to be very sound scientific reasons for investing such a large amount of money in onemicroscope. In this chapter (which is just a brief overview of many of the concepts that we’ll talk about in detail throughout the book) we start by introducing you to some of the historical development of the TEM because the history is intertwined with some of the reasons why you need to use a TEM to characterize materials. Other reasons for using a TEM have appeared as the instrument continues to develop, to the point where it can seriously be claimed that no other scientific instrument exists which can offer such a broad range of characterization techniques with such high spatial and analytical resolution, coupled with a completely quantitative understanding of the various techniques.
@incollection{williams_transmission_2009,
	address = {Boston, MA},
	title = {The {Transmission} {Electron} {Microscope}},
	isbn = {978-0-387-76501-3},
	url = {https://doi.org/10.1007/978-0-387-76501-3_1},
	abstract = {A typical commercial transmission electron microscope (TEM) costs about \$5 for each electron volt (eV) of energy in the beam and, if you add on all available options, it can easily cost up to \$10 per eV. As you’ll see, we use beam energies in the range from 100,000 to 400,000 eV, so a TEMis an extremely expensive piece of equipment. Consequently, there have to be very sound scientific reasons for investing such a large amount of money in onemicroscope. In this chapter (which is just a brief overview of many of the concepts that we’ll talk about in detail throughout the book) we start by introducing you to some of the historical development of the TEM because the history is intertwined with some of the reasons why you need to use a TEM to characterize materials. Other reasons for using a TEM have appeared as the instrument continues to develop, to the point where it can seriously be claimed that no other scientific instrument exists which can offer such a broad range of characterization techniques with such high spatial and analytical resolution, coupled with a completely quantitative understanding of the various techniques.},
	language = {en},
	urldate = {2021-09-02},
	booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
	publisher = {Springer US},
	author = {Williams, David B. and Carter, C. Barry},
	editor = {Williams, David B. and Carter, C. Barry},
	year = {2009},
	doi = {10.1007/978-0-387-76501-3_1},
	keywords = {Electron Energy Loss Spectroscopy, Scanning Transmission Electron Microscope, Transmission Electron Microscope, Transmission Electron Microscope Image, Transmission Electron Microscope Specimen},
	pages = {3--22},
}

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