Thickness and Bending Effects. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, volume 24, pages 407–417. Springer US, Boston, MA, 2009. ![Thickness and Bending Effects [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex We see diffraction contrast in an image for two reasons: either the thickness of the specimen varies or the diffraction conditions change across the specimen: the t effect and the s effect! The thickness effect: when the thickness of the specimen is not uniform, the coupling (interference) of the direct and diffracted beams occurs over different distances, thus producing a thickness effect. Don’t confuse diffraction contrast due to thickness changes with mass-thickness contrast discussed in the previous chapter. The effects are very different. The diffraction contrast changes with small changes in tilt, but the mass-thickness contrast doesn’t.
@incollection{williams_thickness_2009,
address = {Boston, MA},
title = {Thickness and {Bending} {Effects}},
volume = {24},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_24},
abstract = {We see diffraction contrast in an image for two reasons: either the thickness of the specimen varies or the diffraction conditions change across the specimen: the t effect and the s effect! The thickness effect: when the thickness of the specimen is not uniform, the coupling (interference) of the direct and diffracted beams occurs over different distances, thus producing a thickness effect. Don’t confuse diffraction contrast due to thickness changes with mass-thickness contrast discussed in the previous chapter. The effects are very different. The diffraction contrast changes with small changes in tilt, but the mass-thickness contrast doesn’t.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_24},
keywords = {Bloch Wave, Bragg Condition, Diffract Beam, Thickness Effect, Wedge Angle},
pages = {407--417},
}
Downloads: 0
{"_id":"mMzRsipoL7w8Rkoma","bibbaseid":"williams-carter-thicknessandbendingeffects-2009","author_short":["Williams, D. B.","Carter, C. B."],"bibdata":{"bibtype":"incollection","type":"incollection","address":"Boston, MA","title":"Thickness and Bending Effects","volume":"24","isbn":"978-0-387-76501-3","url":"https://doi.org/10.1007/978-0-387-76501-3_24","abstract":"We see diffraction contrast in an image for two reasons: either the thickness of the specimen varies or the diffraction conditions change across the specimen: the t effect and the s effect! The thickness effect: when the thickness of the specimen is not uniform, the coupling (interference) of the direct and diffracted beams occurs over different distances, thus producing a thickness effect. Don’t confuse diffraction contrast due to thickness changes with mass-thickness contrast discussed in the previous chapter. The effects are very different. The diffraction contrast changes with small changes in tilt, but the mass-thickness contrast doesn’t.","language":"en","urldate":"2021-09-02","booktitle":"Transmission Electron Microscopy: A Textbook for Materials Science","publisher":"Springer US","author":[{"propositions":[],"lastnames":["Williams"],"firstnames":["David","B."],"suffixes":[]},{"propositions":[],"lastnames":["Carter"],"firstnames":["C.","Barry"],"suffixes":[]}],"editor":[{"propositions":[],"lastnames":["Williams"],"firstnames":["David","B."],"suffixes":[]},{"propositions":[],"lastnames":["Carter"],"firstnames":["C.","Barry"],"suffixes":[]}],"year":"2009","doi":"10.1007/978-0-387-76501-3_24","keywords":"Bloch Wave, Bragg Condition, Diffract Beam, Thickness Effect, Wedge Angle","pages":"407–417","bibtex":"@incollection{williams_thickness_2009,\n\taddress = {Boston, MA},\n\ttitle = {Thickness and {Bending} {Effects}},\n\tvolume = {24},\n\tisbn = {978-0-387-76501-3},\n\turl = {https://doi.org/10.1007/978-0-387-76501-3_24},\n\tabstract = {We see diffraction contrast in an image for two reasons: either the thickness of the specimen varies or the diffraction conditions change across the specimen: the t effect and the s effect! The thickness effect: when the thickness of the specimen is not uniform, the coupling (interference) of the direct and diffracted beams occurs over different distances, thus producing a thickness effect. Don’t confuse diffraction contrast due to thickness changes with mass-thickness contrast discussed in the previous chapter. The effects are very different. The diffraction contrast changes with small changes in tilt, but the mass-thickness contrast doesn’t.},\n\tlanguage = {en},\n\turldate = {2021-09-02},\n\tbooktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},\n\tpublisher = {Springer US},\n\tauthor = {Williams, David B. and Carter, C. Barry},\n\teditor = {Williams, David B. and Carter, C. Barry},\n\tyear = {2009},\n\tdoi = {10.1007/978-0-387-76501-3_24},\n\tkeywords = {Bloch Wave, Bragg Condition, Diffract Beam, Thickness Effect, Wedge Angle},\n\tpages = {407--417},\n}\n\n","author_short":["Williams, D. B.","Carter, C. B."],"editor_short":["Williams, D. B.","Carter, C. B."],"key":"williams_thickness_2009","id":"williams_thickness_2009","bibbaseid":"williams-carter-thicknessandbendingeffects-2009","role":"author","urls":{"Paper":"https://doi.org/10.1007/978-0-387-76501-3_24"},"keyword":["Bloch Wave","Bragg Condition","Diffract Beam","Thickness Effect","Wedge Angle"],"metadata":{"authorlinks":{}},"html":""},"bibtype":"incollection","biburl":"https://bibbase.org/zotero/spintextures","dataSources":["rx3H6duFmTt3xD5yy","rXHvWQJHcL8ctHS4s"],"keywords":["bloch wave","bragg condition","diffract beam","thickness effect","wedge angle"],"search_terms":["thickness","bending","effects","williams","carter"],"title":"Thickness and Bending Effects","year":2009}