Using Convergent-Beam Techniques. Williams, D. B. & Carter, C. B. In Williams, D. B. & Carter, C. B., editors, Transmission Electron Microscopy: A Textbook for Materials Science, pages 347–368. Springer US, Boston, MA, 2009. ![Using Convergent-Beam Techniques [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can’t obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established techniques largely depend on simple observation of the patterns whereas newer techniques involve quantitative simulations of the patterns.
@incollection{williams_using_2009,
address = {Boston, MA},
title = {Using {Convergent}-{Beam} {Techniques}},
isbn = {978-0-387-76501-3},
url = {https://doi.org/10.1007/978-0-387-76501-3_21},
abstract = {In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can’t obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established techniques largely depend on simple observation of the patterns whereas newer techniques involve quantitative simulations of the patterns.},
language = {en},
urldate = {2021-09-02},
booktitle = {Transmission {Electron} {Microscopy}: {A} {Textbook} for {Materials} {Science}},
publisher = {Springer US},
author = {Williams, David B. and Carter, C. Barry},
editor = {Williams, David B. and Carter, C. Barry},
year = {2009},
doi = {10.1007/978-0-387-76501-3_21},
keywords = {Convergent Beam Electron Diffraction, Ewald Sphere, Mirror Plane, Point Group, Thickness Determination},
pages = {347--368},
}
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