Automation Component Aspects for Efficient Unit Testing. Winkler, D., Hametner, R., & Biffl, S. In ETFA, pages 1-8, 2009. IEEE.
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Paper bibtex @inproceedings{ conf/etfa/WinklerHB09,
added-at = {2011-11-12T00:00:00.000+0100},
author = {Winkler, Dietmar and Hametner, Reinhard and Biffl, Stefan},
biburl = {http://www.bibsonomy.org/bibtex/289b71d8ba37edc17bc0f606618bd529e/dblp},
booktitle = {ETFA},
crossref = {conf/etfa/2009},
ee = {http://doi.ieeecomputersociety.org/10.1109/ETFA.2009.5347022},
interhash = {02dfda68a32d91132ff73501fc16cddf},
intrahash = {89b71d8ba37edc17bc0f606618bd529e},
isbn = {978-1-4244-2727-7},
keywords = {dblp},
pages = {1-8},
publisher = {IEEE},
title = {Automation Component Aspects for Efficient Unit Testing.},
url = {http://dblp.uni-trier.de/db/conf/etfa/etfa2009.html#WinklerHB09},
year = {2009}
}
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