@inproceedings{ conf/itc/WohlW00,
  added-at = {2015-08-26T00:00:00.000+0200},
  author = {Wohl, Peter and Waicukauski, John A.},
  biburl = {http://www.bibsonomy.org/bibtex/23d0db5427b2662d18c2f66ea861a53c4/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2000},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894263},
  interhash = {72329cce1d0860672d57188fdc3bca77},
  intrahash = {3d0db5427b2662d18c2f66ea861a53c4},
  isbn = {0-7803-6546-1},
  keywords = {dblp},
  pages = {681-690},
  publisher = {IEEE Computer Society},
  title = {Optimizing the flattened test-generation model for very large designs.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#WohlW00},
  year = {2000}
}

{"_id":"Qj6MQXEGZLg347Jgi","bibbaseid":"wohl-waicukauski-optimizingtheflattenedtestgenerationmodelforverylargedesigns-2000","downloads":0,"creationDate":"2015-09-08T15:38:34.226Z","title":"Optimizing the flattened test-generation model for very large designs.","author_short":["Wohl, P.","Waicukauski, J.<nbsp>A."],"year":2000,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/john?items=1000","bibdata":{"added-at":"2015-08-26T00:00:00.000+0200","author":["Wohl, Peter","Waicukauski, John A."],"author_short":["Wohl, P.","Waicukauski, J.<nbsp>A."],"bibtex":"@inproceedings{ conf/itc/WohlW00,\n added-at = {2015-08-26T00:00:00.000+0200},\n author = {Wohl, Peter and Waicukauski, John A.},\n biburl = {http://www.bibsonomy.org/bibtex/23d0db5427b2662d18c2f66ea861a53c4/dblp},\n booktitle = {ITC},\n crossref = {conf/itc/2000},\n ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894263},\n interhash = {72329cce1d0860672d57188fdc3bca77},\n intrahash = {3d0db5427b2662d18c2f66ea861a53c4},\n isbn = {0-7803-6546-1},\n keywords = {dblp},\n pages = {681-690},\n publisher = {IEEE Computer Society},\n title = {Optimizing the flattened test-generation model for very large designs.},\n url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#WohlW00},\n year = {2000}\n}","bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bibtex/23d0db5427b2662d18c2f66ea861a53c4/dblp","booktitle":"ITC","crossref":"conf/itc/2000","ee":"http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894263","id":"conf/itc/WohlW00","interhash":"72329cce1d0860672d57188fdc3bca77","intrahash":"3d0db5427b2662d18c2f66ea861a53c4","isbn":"0-7803-6546-1","key":"conf/itc/WohlW00","keywords":"dblp","pages":"681-690","publisher":"IEEE Computer Society","title":"Optimizing the flattened test-generation model for very large designs.","type":"inproceedings","url":"http://dblp.uni-trier.de/db/conf/itc/itc2000.html#WohlW00","year":"2000","bibbaseid":"wohl-waicukauski-optimizingtheflattenedtestgenerationmodelforverylargedesigns-2000","role":"author","urls":{"Link":"http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894263","Paper":"http://dblp.uni-trier.de/db/conf/itc/itc2000.html#WohlW00"},"keyword":["dblp"],"downloads":0},"search_terms":["optimizing","flattened","test","generation","model","very","large","designs","wohl","waicukauski"],"keywords":["dblp"],"authorIDs":[],"dataSources":["e3DPfiLXyfZxic3k2"]}