Grain-boundary segregation in nanocrystalline CuBi layers studied with the tomographic atom probe. Wolde-Giorgis, D., Al-Kassab, T., & Kirchheim, R. Surface and Interface Analysis, 39:246–250, Wiley, 2007.
Grain-boundary segregation in nanocrystalline CuBi layers studied with the tomographic atom probe [link]Paper  doi  bibtex   
@article{10.1002/sia.2523,
doi = {10.1002/sia.2523},
url = {http://dx.doi.org/10.1002/sia.2523},
year = 2007,
publisher = {Wiley},
volume = {39},
pages = {246--250},
author = {Daniel Wolde-Giorgis and Tala{\textquotesingle}at Al-Kassab and Reiner Kirchheim},
title = {Grain-boundary segregation in nanocrystalline CuBi layers studied with the tomographic atom probe},
journal = {Surface and Interface Analysis}
}

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