@article{journals/mr/WronskiKMD05,
  added-at = {2007-03-27T00:00:00.000+0200},
  author = {Wronski, Marek and Kaminski, Slawomir and Mis, Edward and Dziedzic, Andrzej},
  biburl = {http://www.bibsonomy.org/bibtex/252489a6ff55331c00b79df65e48a9b49/dblp},
  date = {2007-03-27},
  description = {dblp},
  ee = {http://dx.doi.org/10.1016/j.microrel.2005.03.006},
  interhash = {12efcdc5639987261aab569d70192ab9},
  intrahash = {52489a6ff55331c00b79df65e48a9b49},
  journal = {Microelectronics Reliability},
  keywords = {dblp},
  number = 12,
  pages = {1941-1948},
  timestamp = {2007-06-15T08:14:20.000+0200},
  title = {New trim configurations for laser trimmed thick-film resistors - theoretical analysis, numerical simulation and experimental verification.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#WronskiKMD05},
  volume = 45,
  year = 2005
}

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