Fault Diagnosis Based on K-Means Clustering and PNN. Wu, D., Yang, Q., Tian, F., & Zhang, D. X. In 2010 Third International Conference on Intelligent Networks and Intelligent Systems, pages 173–176, November, 2010. doi abstract bibtex This paper presents the development of an algorithm based on K-Means clustering and probabilistic neural network (PNN) for classifying the industrial system faults. The proposed technique consists of a preprocessing unit based on K-Means clustering and probabilistic neural network (PNN). Given a set of data points, firstly the K-Means algorithm is used to obtain K-temporary clusters, and then PNN is used to diagnose faults. To validate the performance and effectiveness of the proposed scheme, K-Means and PNN are applied to diagnose the faults in TE Process. Simulation studies show that the proposed algorithm not only provides an accepted degree of accuracy in fault classification under different fault conditions and the result is also reliable.
@inproceedings{wu_fault_2010,
title = {Fault {Diagnosis} {Based} on {K}-{Means} {Clustering} and {PNN}},
doi = {10.1109/ICINIS.2010.169},
abstract = {This paper presents the development of an algorithm based on K-Means clustering and probabilistic neural network (PNN) for classifying the industrial system faults. The proposed technique consists of a preprocessing unit based on K-Means clustering and probabilistic neural network (PNN). Given a set of data points, firstly the K-Means algorithm is used to obtain K-temporary clusters, and then PNN is used to diagnose faults. To validate the performance and effectiveness of the proposed scheme, K-Means and PNN are applied to diagnose the faults in TE Process. Simulation studies show that the proposed algorithm not only provides an accepted degree of accuracy in fault classification under different fault conditions and the result is also reliable.},
booktitle = {2010 {Third} {International} {Conference} on {Intelligent} {Networks} and {Intelligent} {Systems}},
author = {Wu, Dongsheng and Yang, Qing and Tian, Feng and Zhang, Dong Xu},
month = nov,
year = {2010},
keywords = {Artificial neural networks, Clustering algorithms, Cooling, Fault diagnosis, Feeds, K-Means, Neurons, PNN, TE process, cluster, fault diagnosis},
pages = {173--176},
}
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