Zero-shot learning—a comprehensive evaluation of the good, the bad and the ugly. Xian, Y., Lampert, C. H, Schiele, B., & Akata, Z. IEEE transactions on pattern analysis and machine intelligence, 41(9):2251–2265, IEEE, 2018.
bibtex   
@article{xian2018zero,
  title={Zero-shot learning—a comprehensive evaluation of the good, the bad and the ugly},
  author={Xian, Yongqin and Lampert, Christoph H and Schiele, Bernt and Akata, Zeynep},
  journal={IEEE transactions on pattern analysis and machine intelligence},
  volume={41},
  number={9},
  pages={2251--2265},
  year={2018},
  publisher={IEEE}
}

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