DetecVFuzz: Enhancing Security in Consumer Electronic Devices Through Scalable Vulnerability Testing of Virtual Devices. Xiao, X., Guo, Y., Jolfaei, A., Chen, C., Haghighi, M. S., Wen, S., & Lin, Y. IEEE Transactions on Consumer Electronics, 2025.
doi  bibtex   
@ARTICLE{Xiao2025Detec,
  author={Xiao, Xi and Guo, Yongjian and Jolfaei, Alireza and Chen, Chuan and Haghighi, Mohammad Sayad and Wen, Sheng and Lin, Yuanyi},
  journal={IEEE Transactions on Consumer Electronics}, 
  title={DetecVFuzz: Enhancing Security in Consumer Electronic Devices Through Scalable Vulnerability Testing of Virtual Devices}, 
  year={2025},
  volume={},
  number={},
  pages={1-1}, 
  doi={10.1109/TCE.2025.3525512}
}

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