Reducing coercive-field scaling in ferroelectric thin films via orientation control. Xu, R., Gao, R., Reyes-Lillo, S. E, Saremi, S., Dong, Y., Lu, H., Chen, Z., Lu, X., Qi, Y., Hsu, S., & others ACS nano, 12(5):4736–4743, American Chemical Society, 2018.
bibtex   
@article{xu2018reducing,
  title={Reducing coercive-field scaling in ferroelectric thin films via orientation control},
  author={Xu, Ruijuan and Gao, Ran and Reyes-Lillo, Sebastian E and Saremi, Sahar and Dong, Yongqi and Lu, Hongling and Chen, Zuhuang and Lu, Xiaoyan and Qi, Yajun and Hsu, Shang-Lin and others},
  journal={ACS nano},
  volume={12},
  number={5},
  pages={4736--4743},
  year={2018},
  publisher={American Chemical Society}
}

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